PROCESS × DEVICE · FRONT-LINE SEMICONDUCTOR PROCESS ENGINEER

From 55nm to 14nm, and 32- to 196-layer 3D NAND —
all built hands-on

I'm Diamond. 11 years on the semiconductor production line — from 55nm down to 14nm logic, and from 32-layer to 196-layer 3D NAND, I took multiple product lines from zero to one and owned the full yield ramp-to-mass-production cycle. Not seen-it, done-it.

CVD thin-film (low-k / STI HARP / high-stress SiN) and CMOS devices — I've hit the wall on both. The hybrid process-device background lets me translate a process issue straight into device language to find root cause. 60+ patents and years of yield & failure triage notes are baked into the docs here.

Stuck on a process window that won't move, a resume that undersells you, or an interview "why" you can't nail? I can help turn that fuzzy instinct into an actionable plan and a story you can tell clearly.

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PRODUCTS

Paid Docs · One-Stop Catalog

13 paid docs and consulting services, grouped by track. Buy & use instantly after payment.

Career Growth

Job Map / 01

Semiconductor Big-Company Job Map

Company landscape, core roles (CVD / device / PIE / YE / TD), interview hot topics, salary ranges and strategy. 11 yrs experience. PDF 9 pages.

¥9.9
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Interview Bank / 01

Semiconductor Interview Question Bank

8 modules ~50 questions (answers + analysis): process basics / CVD / CMOS / PIE / yield / reliability / EHS / behavioral. PDF 19 pages.

¥19.9
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CVD 50 / 01

CVD Process Interview 50 Q&A

50 high-frequency CVD thin-film interview questions with analysis — vertical deep-dive for process roles.

¥29.9
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Process Tech Reports

SiN / 01

High-Tensile-Stress SiN Thin Film

NMOS strain engineering: PECVD stress tuning, UV cure, SMT integration and reliability trade-offs. PDF ~13 pages.

¥49
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APF / 01

APF Amorphous-Carbon Hard Mask

Etch selectivity, stress control and low-k-compatible integration, with optimized extended notes.

¥59
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low-k / 01

Advanced low-k / ULK Thin-Film Tech

k-reduction physics, FSG / CDO / porous-ULK families, precursors, UV cure and PID mechanisms. PDF 22 pages.

¥69
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NDC / 01

N-Doped SiC (NDC / SiCN) Thin Film

k / stress / step-coverage / reliability trade-offs, Cu diffusion barrier applications and deposition window.

¥69
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HARP / 01

STI & ILD HARP Gap-Fill

Ozone-TEOS, flowable oxide and void control, from shallow trench to inter-layer dielectric fill.

¥69
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CMOS / 01

CMOS Device Failure Effects

HCI / NBTI / PBTI / TDDB reliability + advanced module walkthrough. PDF 39 pages.

¥99
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Diamond / 01

MPCVD Semiconductor-Grade Diamond

Nucleation, doping and thermal-management applications — semiconductor-grade diamond film report. PDF 42 pages.

¥129
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Consulting & Membership

Consult / 01

Semiconductor Q&A & Career Consulting

6 questions covering process/device tech difficulties and career planning, with illustrated answers. ¥40 / 6 questions.

¥40
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Bundle / 01

Complete Paid-Doc Bundle

All 6 process reports in one bundle — best value for the full picture.

¥375
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Membership / 01

Diamond Circle Membership

Continuously updated docs + real Q&A. Join once, benefit long-term.

¥299
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COMMUNITY

Diamond Semiconductor Circle · Knowledge Planet

Beyond the docs — a hands-on community for ongoing Q&A, frontier tracking, and real talk with peers.

Buying a doc is a one-time grab; joining the circle is compounding. Here I keep breaking down the process windows, stress trade-offs and defect mechanisms that docs can't fully cover and papers don't explain — straight from 11 years on the line. Your real fab questions get answered inside.

Current Columns

Semiconductor Job & Interview Coaching

Latest job market intel and interview strategy

Diamond Film Circle

Diamond thin-film deposition process roundup

CMOS Device & Flow Deep Dives

28nm/40nm logic CMOS device physics and failure analysis

CVD Thin-Film Process Circle

ULK, low-k, STI HARP and other advanced CVD process notes

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Services

What I can help with

Turning front-line experience into deliverables. All services are based on open-domain knowledge and methodology — no confidential information from any former employer is involved.

01

Résumé Optimization (Semiconductor)

Tailored to process / device / PIE / YE roles — restructure your résumé and quantify the impact so recruiters and interviewers see the highlights in 10 seconds.

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02

Mock Interview (Device / PIE)

Role-play technical interviews based on real job descriptions — covering thin-film process, device physics, failure analysis and project deep-dives.

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03

Technical Consulting / Process Review

Part-time advisory for equipment vendors, material suppliers and startups on thin-film process windows and device-structure reviews.

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04

Process Training / Knowledge Sharing

Hands-on semiconductor thin-film process courses and public talks for new grads and career-switchers.

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Writing

Articles & thoughts

Turning the pitfalls and the "aha" moments from the fab into reusable methodology.

05failure modes
Semiconductor thin-film process · field checklist

5 Common CVD Thin-Film Failure Modes — A Field Checklist from an 11-Year Process Engineer

Poor uniformity, particle contamination, step-coverage voids, film stress cracking, and abnormal electrical/composition. Each with its symptom, mechanism and debugging path.

Read more →
06low-k
Semiconductor thin-film process · materials & mechanisms

Advanced Process: Ultra-Low-k (low-k / ULK) Thin-Film Technology Explained

Why low-k is needed, the properties it must satisfy, k-reduction physics, FSG / CDO / porous-ULK families, precursor chemistry, UV cure and PID mechanisms, and the core trade-off.

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07reliability
CMOS device · reliability & advanced modules

CMOS Device Failure Effects & Advanced Process Modules — downloadable PDF (39 pages)

HCI / NBTI / PBTI / TDDB reliability degradation, plus STI, well engineering, salicide, SMT and low-k interconnect — systematically explained. Available as a PDF.

View the PDF →
08gap fill
Semiconductor thin-film process · STI / ILD HARP

HARP Gap-Fill Got a Seam? Don't Touch the Recipe Yet

When HARP shows seam defects, the root cause is 80% upstream — not in the recipe. Plus the hidden substrate selectivity variable and the H2 treatment switch. Complete handbook with measured data, debug checklist, and 16 diagrams.

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···
Coming soon

From 3D NAND to Logic Devices: A Process-Device Engineer's Perspective

Why people who span process-device are scarcer — and more valuable — in PIE / YE roles.

Stay tuned
Contact

Let's talk about your need

Career coaching, technical collaboration, content partnership — all welcome. Usually same-day reply on working days.

StatusPhD in progress · open to collaboration
PrincipleOpen-domain · compliant & confidential
WeChat QR - Liu_Diamond36
WeChat: 天行健 (Tianxingjian) · ID: Liu_Diamond36WeChat ID: Liu_Diamond36 (searchable on WeChat)Email: liucongbaobei@qq.com (preferred for international inquiries)Career coaching / technical collaboration / content partnership. I'll reply after verification. If the QR fails, search WeChat ID Liu_Diamond36 to add.
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※ All collaboration is based on open-domain knowledge and personal experience, in compliance with confidentiality and non-compete requirements.